Electrical Detection of Spin Accumulation at a Ferromagnet-Semiconductor Interface
arXiv:cond-mat/0602096 · doi:10.1103/PhysRevLett.96.176603
Abstract
We show that the accumulation of spin-polarized electrons at a forward-biased Schottky tunnel barrier between Fe and n-GaAs can be detected electrically. The spin accumulation leads to an additional voltage drop across the barrier that is suppressed by a small transverse magnetic field, which depolarizes the spins in the semiconductor. The dependence of the electrical accumulation signal on magnetic field, bias current, and temperature is in good agreement with the predictions of a drift-diffusion model for spin-polarized transport.
Submitted to Phys. Rev. Lett
Cited by in corpus (14)
- Electrical Detection of Spin Transport in Lateral Ferromagnet-Semiconductor Devices
- Electronic measurement and control of spin transport in Silicon
- Coherent spin transport through a 350-micron-thick Silicon wafer
- Electronic spin drift in graphene field effect transistors
- Generating Spin Currents in Semiconductors with the Spin Hall Effect
- Semiconductors between spin-polarized source and drain
- Spin extraction theory and its relevance to spintronics
- Experimental realization of a silicon spin field-effect transistor
- Detection of current-induced spins by ferromagnetic contacts
- Bias-dependent electron spin lifetimes in n-GaAs and the role of donor impact ionization
- Non-ohmic spin transport in n-type doped silicon
- Optical and electrical spin injection and spin transport in hybrid Fe/GaAs devices
- Nanomechanical Spin-Polarizer
- Electrical expression of spin accumulation in ferromagnet/semiconductor structures