Bias-dependent electron spin lifetimes in n-GaAs and the role of donor impact ionization
arXiv:cond-mat/0605742 · doi:10.1063/1.2345608
Abstract
In bulk n-GaAs epilayers doped near the metal-insulator transition, we study the evolution of electron spin lifetime as a function of applied lateral electrical bias . is measured via the Hanle effect using magneto-optical Kerr rotation. At low temperatures (T<10 K, where electrons are partially localized and ns at zero bias), a marked collapse of is observed when exceeds the donor impact ionization threshold at 10 V/cm. A steep increase in the concentration of warm delocalized electrons -- subject to Dyakonov-Perel spin relaxation -- accounts for the rapid collapse of , and strongly influences electron spin transport in this regime.
arXiv comment4 pages, 3 figures
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