Raman spectroscopy as probe of nanometer-scale strain variations in graphene

Abstract

Confocal Raman spectroscopy is a versatile, non-invasive investigation tool and a major workhorse for graphene characterization. Here we show that the experimentally observed Raman 2D line width is a measure of nanometer-scale strain variations in graphene. By investigating the relation between the G and 2D line at high magnetic fields we find that the 2D line width contains valuable information on nanometer-scale flatness and lattice deformations of graphene, making it a good quantity for classifying the structural quality of graphene even at zero magnetic field.

7 pages, 4 figures

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• Impact of thermal annealing on graphene devices encapsulated in hexagonal boron nitride
• Electrical switch to the resonant magneto-phonon effect in graphene

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