Optical detection of strain and doping inhomogenieties in single layer MoS2
arXiv:1804.10127 · doi:10.1063/1.4948357
Abstract
Van der Waals single-layer materials are characterized by an inherent extremely low bending rigidity and therefore are prone to nanoscale structural modifications due to substrate interactions. Such interactions can induce excess charge concentration, conformational ripples and residual mechanical strain. In this work, we employed spatially resolved Raman and Photoluminescence images to investigate strain and doping inhomogeneities in a single layer exfoliated Molybdenum disulphide crystal. We have found that correlations between the spectral parameters of the most prominent Raman bands A1' and E' enable us to decouple and quantify strain and charge doping effects. In comparison with AFM topography, we show that the spatial distribution of the linewidth of the A-exciton peak is strain sensitive and can capture features smaller than the laser spot size. The presented optical analysis may have implications in the development of high-quality devices based on two-dimensional materials since structural and electronic modifications affect considerably their carrier mobility and conductivity.
12 pages, 3 figures
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- Weakly Trapped, Charged, and Free Excitons in Single-Layer MoS2 in the Presence of Defects, Strain, and Charged Impurities
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- Apparent Differences between Single Layer Molybdenum Disulfide Fabricated via Chemical Vapor Deposition and Exfoliation
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- Atomic resolution interface structure and vertical current injection in highly uniform heterojunctions with bulk GaN
- Synthesis of built-in highly strained monolayer MoS2 using liquid precursor chemical vapor deposition
- Unexpected Electron Transport Suppression in a Heterostructures Graphene MoS2 Multiple Field-Effect Transistor Architecture
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- Direct observation of strain-induced orbital valence band splitting in HfSe by sodium intercalation
- Electrically pumped h-BN single-photon emission in van der Waals heterostructure
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- Strain- and potential-controlled tunneling in monolayer MoS