Correlating Nanocrystalline Structure with Electronic Properties in 2D Platinum Diselenide

Abstract

Platinum diselenide (PtSe${}_2$) is a two-dimensional (2D) material with outstanding electronic and piezoresistive properties. The material can be grown at low temperatures in a scalable manner which makes it extremely appealing for many potential electronics, photonics, and sensing applications. Here, we investigate the nanocrystalline structure of different PtSe${}_2$ thin films grown by thermally assisted conversion (TAC) and correlate them with their electronic and piezoresistive properties. We use scanning transmission electron microscopy for structural analysis, X-ray photoelectron spectroscopy (XPS) for chemical analysis, and Raman spectroscopy for phase identification. Electronic devices are fabricated using transferred PtSe${}_2$ films for electrical characterization and piezoresistive gauge factor measurements. The variations of crystallite size and their orientations are found to have a strong correlation with the electronic and piezoresistive properties of the films, especially the sheet resistivity and the effective charge carrier mobility. Our findings may pave the way for tuning and optimizing the properties of TAC-grown PtSe${}_2$ towards numerous applications.

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Cited by in corpus (3)

• Raman spectroscopy of monolayer to bulk PtSe2 exfoliated crystals
• Metal-Organic Chemical Vapor Deposition of PtSe2
• Piezoresistive PtSe${}_2$ pressure sensors with reliable high sensitivity and their integration into CMOS ASIC substrates