Interaction Effects in Conductivity of Si Inversion Layers at Intermediate Temperatures
arXiv:cond-mat/0205449 · doi:10.1103/PhysRevLett.91.126403
Abstract
We compare the temperature dependence of resistivity ρ(T) of Si MOSFETs with the recent theory by Zala et al. This comparison does not involve any fitting parameters: the effective mass m* and g*-factor for mobile electrons have been found independently. An anomalous increase of ρwith temperature, which has been considered a signature of the "metallic" state, can be described quantitatively by the interaction effects in the ballistic regime. The in-plane magnetoresistance ρ(B) is qualitatively consistent with the theory; however, the lack of quantitative agreement indicates that the magnetoresistance is more susceptible to the sample-specific effects than ρ(T).
4 pages, 5 figures. References updated
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