Exclusion of quantum coherence as the origin of the 2D metallic state in high-mobility silicon inversion layers
arXiv:cond-mat/0007230 · doi:10.1103/PhysRevLett.87.096802
Abstract
The temperature and density dependence of the phase coherence time in high-mobility silicon inversion layers was determined from the magnetoresistivity due to weak localization. The upper temperature limit for single-electron quantum interference effects was delineated by comparing with the momentum relaxation time . A comparison between the density dependence of the borders for quantum interference effects and the strong resistivity drop reveals that theses effects are not related to each other. As the strong resistivity drop occurs in the Drude regime, the apparent metallic behavior can not be caused by quantum coherent effects.
arXiv comment4 pages, 3 figs, LaTeX; new title, stronger conclusions
References in corpus (12)
- Metallic behavior and related phenomena in two dimensions
- Possible Metal/Insulator Transition at B=0 in Two Dimensions
- Rashba spin splitting in two-dimensional electron and hole systems
- Spin Degree of Freedom in a Two-Dimensional Electron Liquid
- Charged impurity scattering limited low temperature resistivity of low density silicon inversion layers
- On the Theory of Metal-Insulator Transitions in Gated Semiconductors
- Superconductivity in a two-dimensional Electron Gas
- Weak localisation, hole-hole interactions and the "metal"-insulator transition in two dimensions
- Coexistence of Weak Localization and a Metallic Phase in Si/SiGe Quantum Wells
- Anomalous magneto-oscillations in two-dimensional systems
- On the Relation between Interband Scattering and the "Metallic Phase" of Two Dimensional Holes in GaAs/AlGaAs
- Analysis of the Metallic Phase of Two-Dimensional Holes in SiGe in Terms of Temperature Dependent Screening
Cited by in corpus (20)
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- The energy scale behind the metallic behaviors in low-density Si-MOSFETs
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- Quantum decoherence of interacting electrons in arrays of quantum dots and diffusive conductors
- Intervalley scattering and weak localization in Si-based two-dimensional structures
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- Signatures of localization in the effective metallic regime of high mobility Si MOSFETs
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- Phase Separation in Two-Dimensional Electron Systems: Experimental View
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