Coherent back-scattering near the two-dimensional metal-insulator transition
arXiv:cond-mat/0210008 · doi:10.1103/PhysRevLett.91.116402
Abstract
We have studied corrections to conductivity due to the coherent backscattering in low-disordered two-dimensional electron systems in silicon for a range of electron densities including the vicinity of the metal-insulator transition, where the dramatic increase of the spin susceptibility has been observed earlier. We show that the corrections, which exist deeper in the metallic phase, weaken upon approaching to the transition and practically vanish at the critical density, thus suggesting that the localization is suppressed near and at the transition even in zero field.
arXiv commentto appear in PRL
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- Signatures of localization in the effective metallic regime of high mobility Si MOSFETs
- Test of scaling theory in two dimensions in the presence of valley splitting and intervalley scattering in Si-MOSFETs
- Renormalization group study of intervalley scattering and valley splitting in a two-valley system
- Renormalization group study of a two-valley system with spin-splitting
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- Non-Gaussian Spatial Correlations Dramatically Weaken Localization
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