Quantum transport properties of industrial Si/SiO
arXiv:1810.06521 · doi:10.1103/PhysRevApplied.12.014013
Abstract
We investigate the structural and quantum transport properties of isotopically enriched Si/SiO stacks deposited on 300 mm Si wafers in an industrial CMOS fab. Highly uniform films are obtained with an isotopic purity greater than 99.92\%. Hall-bar transistors with an equivalent oxide thickness of 17 nm are fabricated in an academic cleanroom. A critical density for conduction of cm and a peak mobility of 9800 cm/Vs are measured at a temperature of 1.7 K. The Si/SiO interface is characterized by a roughness of nm and a correlation length of nm. An upper bound for valley splitting energy of 480 eV is estimated at an effective electric field of 9.5 MV/m. These results support the use of wafer-scale Si/SiO as a promising material platform to manufacture industrial spin qubits.
arXiv comment5 pages, 3 figures
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