Transport and percolation in a low-density high-mobility two-dimensional hole system
arXiv:0710.3542 · doi:10.1103/PhysRevLett.99.236402
Abstract
We present a study of the temperature and density dependence of the resistivity of an extremely high quality two-dimensional hole system grown on the (100) surface of GaAs. For high densities in the metallic regime ($p\agt 4 \times 10^{9}$ cm), the nonmonotonic temperature dependence ( mK) of the resistivity is consistent with temperature dependent screening of residual impurities. At a fixed temperature of = 50 mK, the conductivity vs. density data indicates an inhomogeneity driven percolation-type transition to an insulating state at a critical density of cm.
accepted for publication in PRL
References in corpus (3)
- Metal-insulator transition in two-dimensional electron systems
- Two-dimensional metal-insulator transition and in-plane magnetoresistance in a high mobility strained Si quantum well
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