Single-shot measurement and tunnel-rate spectroscopy of a Si/SiGe few-electron quantum dot
arXiv:1010.0972 · doi:10.1103/PhysRevB.84.045307
Abstract
We investigate the tunnel rates and energies of excited states of small numbers of electrons in a quantum dot fabricated in a Si/SiGe heterostructure. Tunnel rates for loading and unloading electrons are found to be strongly energy dependent, and they vary significantly between different excited states. We show that this phenomenon enables charge sensing measurements of the average electron occupation that are analogous to Coulomb diamonds. Excited-state energies can be read directly from the plot, and we develop a rate model that enables a quantitative understanding of the relative sizes of different electron tunnel rates.
9 pages
References in corpus (7)
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Cited by in corpus (17)
- Silicon Quantum Electronics
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- Tunable singlet-triplet splitting in a few-electron Si/SiGe quantum dot
- Disorder-induced valley-orbit hybrid states in Si quantum dots
- Two-electron dephasing in single Si and GaAs quantum dots
- Few electron double quantum dot in an isotopically purified Si quantum well
- Coherent electrical rotations of valley states in Si quantum dots using the phase of the valley-orbit coupling
- Single charge sensing and transport in double quantum dots fabricated from commercially grown Si/SiGe heterostructures
- SiGe/Si quantum dot electron spin decoherence dependence on Ge
- Identifying single electron charge sensor events using wavelet edge detection
- Characterization of a gate-defined double quantum dot in a Si/SiGe nanomembrane
- Spin Accumulation Encoded in Electronic Noise for Mesoscopic Billiards with Finite Tunneling Rates
- Spectroscopy of multi-electrode tunnel barriers
- Control of threshold voltages in Si/SiGe quantum devices via optical illumination
- Charge detection of a quantum dot under different tunneling barrier symmetries and bias voltages