Energy Dependent Tunneling in a Quantum Dot
arXiv:cond-mat/0610679 · doi:10.1103/PhysRevLett.98.036802
Abstract
We present measurements of the rates for an electron to tunnel on and off a quantum dot, obtained using a quantum point contact charge sensor. The tunnel rates show exponential dependence on drain-source bias and plunger gate voltages. The tunneling process is shown to be elastic, and a model describing tunneling in terms of the dot energy relative to the height of the tunnel barrier quantitatively describes the measurements.
4 pages, 4 figures
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