Controlled emission time statistics of a dynamic single-electron transistor

Abstract

Quantum technologies involving qubit measurements based on electronic interferometers rely critically on accurate single-particle emission. However, achieving precisely timed operations requires exquisite control of the single-particle sources in the time domain. Here, we demonstrate accurate control of the emission time statistics of a dynamic single-electron transistor by measuring the waiting times between emitted electrons. By ramping up the modulation frequency, we controllably drive the system through a crossover from adiabatic to nonadiabatic dynamics, which we visualize by measuring the temporal fluctuations at the single-electron level and explain using detailed theory. Our work paves the way for future technologies based on the ability to control, transmit, and detect single quanta of charge or heat in the form of electrons, photons, or phonons.

5+2 pages, 3 figures, published in Science Advances

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Cited by in corpus (12)

• Electron Waiting Times in a Strongly Interacting Quantum Dot: Interaction Effects and Higher-Order Tunneling Processes
• Partition of Two Interacting Electrons by a Potential Barrier
• Electronic statistics-on-demand: bunching, anti-bunching, positive and negative correlations in a molecular spin-valve
• Multi-particle interference in an electronic Mach-Zehnder interferometer
• Dynamic Cooper Pair Splitter
• Photon emission statistics of a driven microwave cavity
• Nonlocality of Majorana bound states revealed by electron waiting times in a topological Andreev interferometer
• Real-Time Detection and Control of Correlated Charge Tunneling in a Quantum Dot
• Electron shuttle as an autonomous single-electron source
• Transfer-matrix summation of path integrals for transport through nanostructures
• Universal scaling of adiabatic tunneling out of a shallow confinement potential
• Current cross-correlation spectroscopy of Majorana bound states