Rayleigh Imaging of Graphene and Graphene Layers

Abstract

We investigate graphene and graphene layers on different substrates by monochromatic and white-light confocal Rayleigh scattering microscopy. The image contrast depends sensitively on the dielectric properties of the sample as well as the substrate geometry and can be described quantitatively using the complex refractive index of bulk graphite. For few layers (<6) the monochromatic contrast increases linearly with thickness: the samples behave as a superposition of single sheets which act as independent two dimensional electron gases. Thus, Rayleigh imaging is a general, simple and quick tool to identify graphene layers, that is readily combined with Raman scattering, which provides structural identification.

8 pages, 9 figures

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• Graphene field effect transistors as room-temperature Terahertz detectors
• Raman Spectroscopy of Graphene Edges
• Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy
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• From Graphene to Carbon Fibres: Mechanical Deformation and Development of a Universal Stress Sensor
• Dirac electronic states in graphene systems: Optical spectroscopy studies
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• Reliably Counting Atomic Planes of Few-Layer Graphene (n>4)
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• High contrast imaging and thickness determination of graphene with in-column secondary electron microscopy
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• Vortex and gap generation in gauge models of graphene
• Enhanced Optical Conductivity Induced by Surface States in ABC-stacked Few-Layer Graphene
• Enhancing visibility of graphene on arbitrary substrates by microdroplet condensation
• Polarization Dependence of Raman Spectra in Strained Graphene
• Conductance enhancement due to atomic potential fluctuations in graphene
• Optical Dichroism by Nonlinear Excitations in Graphene Nanoribbons