Enhanced Visibility of MoS2, MoSe2, WSe2 and Black Phosphorus: Making Optical Identification of 2D Semiconductors Easier
arXiv:1511.05474 · doi:10.3390/electronics4040847
Abstract
We explore the use of Si3N4/Si substrates as a substitute of the standard SiO2/Si substrates employed nowadays to fabricate nanodevices based on 2D materials. We systematically study the visibility of several 2D semiconducting materials that are attracting a great deal of interest in nanoelectronics and optoelectronics: MoS2, MoSe2, WSe2 and black phosphorus. We find that the use of Si3N4/Si substrates provides an increase of the optical contrast up to a 50%-100% and also the maximum contrast shifts towards wavelength values optimal for human eye detection, making optical identification of 2D semiconductors easier.
arXiv comment4 figures + 3 supp.info. figures
References in corpus (15)
- Two Dimensional Atomic Crystals
- Anomalous Lattice Vibrations of Single and Few-Layer MoS2
- Grains and grain boundaries in highly crystalline monolayer molybdenum disulfide
- Making graphene visible
- Photocurrent generation with two-dimensional van der Waals semiconductors
- Black phosphorus: narrow gap, wide applications
- Rayleigh Imaging of Graphene and Graphene Layers
- Rapid and reliable thickness identification of two-dimensional nanosheets using optical microscopy
- Effect of high-k environment on charge carrier mobility in graphene
- Simple approach for high-contrast optical imaging and characterization of graphene-based sheets
- Optical identification of atomically thin dichalcogenide crystals
- Visibility of graphene flakes on a dielectric substrate
- Colors Of Graphite On Silicon Dioxide
- Spatially resolved optical absorption spectroscopy of single- and few-layer MoS2 by hyperspectral imaging
- Heterostructures produced from nanosheet-based inks
Cited by in corpus (8)
- High-Specific-Power Flexible Transition Metal Dichalcogenide Solar Cells
- Imaging Spectroscopic Ellipsometry of Mono- and Few-layer MoS2
- Universal image segmentation for optical identification of 2D materials
- Optical contrast and refractive index of natural van der Waals heterostructure nanosheets of franckeite
- Thickness identification of thin InSe by optical microscopy methods
- Optical-based thickness measurement of MoO nanosheets
- Lithography-free electrical transport measurements on 2D materials by direct microprobing
- Biaxial strain tuning of excitons in monolayer MoSe by high-temperature physical vapor deposition