AlCl-dosed Si(100)-21: Adsorbates, chlorinated Al chains, and incorporated Al
arXiv:2101.09265 · doi:10.1021/acs.jpcc.1c00691
Abstract
The adsorption of AlCl on Si(100) and the effect of annealing the AlCl-dosed substrate was studied to reveal key surface processes for the development of atomic-precision acceptor-doping techniques. This investigation was performed via scanning tunneling microscopy (STM), X-ray photoelectron spectroscopy (XPS), and density functional theory (DFT) calculations. At room temperature, AlCl readily adsorbed to the Si substrate dimers and dissociated to form a variety of species. Annealing of the AlCl-dosed substrate at temperatures below 450 C produced unique chlorinated aluminum chains (CACs) elongated along the Si(100) dimer row direction. An atomic model for the chains is proposed with supporting DFT calculations. Al was incorporated into the Si substrate upon annealing at 450 C and above, and Cl desorption was observed for temperatures beyond 450 C. Al-incorporated samples were encapsulated in Si and characterized by secondary ion mass spectrometry (SIMS) depth profiling to quantify the Al atom concentration, which was found to be in excess of 10 cm across a 2.7 nm thick -doped region. The Al concentration achieved here and the processing parameters utilized promote AlCl as a viable gaseous precursor for novel acceptor-doped Si materials and devices for quantum computing.
35 pages, 8 figures
References in corpus (4)
- Quantum ESPRESSO: a modular and open-source software project for quantum simulations of materials
- All-optical lithography process for contacting atomically-precise devices
- Superconducting-semiconductor quantum devices: from qubits to particle detectors
- Superconductivity in doped cubic silicon: an ab initio study
Cited by in corpus (8)
- Area-selective deposition and B -doping of Si(100) with BCl
- Roadmap on Atomic-scale Semiconductor Devices
- Hole in one: Pathways to deterministic single-acceptor incorporation in Si(100)-21
- PBr3 Adsorption and Dissociation on the Si(100) Surface
- Electronic structure of boron and aluminum -doped layers in silicon
- Enhancing the reactivity of Si(100)-Cl toward PBr3 by charging Si dangling bonds
- First principles band structure of interacting phosphorus and boron/aluminum -doped layers in silicon
- Dopant Precursor Adsorption into Single-Dimer Windows: Towards Guided Self-Assembly of Dopant Arrays on Si(100)