Suppressing twin formation in Bi2Se3 thin films
arXiv:1503.06498 · doi:10.1002/admi.201400134
Abstract
The microstructure of Bi2Se3 topological-insulator thin films grown by molecular beam epitaxy on InP(111)A and InP(111)B substrates that have different surface roughnesses has been studied in detail using X-ray diffraction, X-ray reflectivity, atomic force microscopy and probe-corrected scanning transmission electron microscopy. The use of a rough Fe-doped InP(111)B substrate results in complete suppression of twin formation in the Bi2Se3 thin films and a perfect interface between the films and their substrates. The only type of structural defects that persist in the "twin-free" films is an antiphase domain boundary, which is associated with variations in substrate height. It is also shown that the substrate surface termination determines which family of twin domains dominates.
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- Epitaxy and Structural Properties of (V,Bi,Sb)Te Layers Exhibiting the Quantum Anomalous Hall Effect
- Studies on the origin of the interfacial superconductivity of Sb2Te3/Fe1+yTe heterostructures
- Optimization of the growth of the van der Waals materials Bi2Se3 and (Bi0.5In0.5)2Se3 by molecular beam epitaxy
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- Breaking crystalline symmetry of epitaxial SnTe films by strain
- Local moment formation and magnetic coupling of Mn guest atoms in BiSe: a low-temperature ferromagnetic resonance study
- Twin Domain Structure in Magnetically Doped Topological Insulators
- Control of 2D plasmons in the topological insulator Bi2Se3 with highly crystalline C60 overlayers
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