Drain Voltage Scaling in Carbon Nanotube Transistors

Abstract

While decreasing the oxide thickness in carbon nanotube field-effect transistors (CNFETs) improves the turn-on behavior, we demonstrate that this also requires scaling the range of the drain voltage. This scaling is needed to avoid an exponential increase in Off-current with drain voltage, due to modulation of the Schottky barriers at both the source and drain contact. We illustrate this with results for bottom-gated ambipolar CNFETs with oxides of 2 and 5 nm, and give an explicit scaling rule for the drain voltage. Above the drain voltage limit, the Off-current becomes large and has equal electron and hole contributions. This allows the recently reported light emission from appropriately biased CNFETs.

4 pages, 4 EPS figure, to appear in Appl. Phys. Lett. (issue of 15 Sept 2003)

References in corpus (2)

• Carbon Nanotubes as Schottky Barrier Transistors
• Transport through the Interface between a Semiconducting Carbon Nanotube and a Metal Electrode

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