Detection of a large valley-orbit splitting in silicon with two-donor spectroscopy
arXiv:1207.2901 · doi:10.1103/PhysRevLett.108.206812
Abstract
We measure a large valley-orbit splitting for shallow isolated phosphorus donors in a silicon gated nanowire. This splitting is close to the bulk value and well above previous reports in silicon nanostructures. It was determined using a double dopant transport spectroscopy which eliminates artifacts induced by the environment. Quantitative simulations taking into account the position of the donors with respect to the Si/SiO interface and electric field in the wire show that the values found are consistent with the device geometry.
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