18 citations · 140 across the 21 of their papers we have counts for
21 papers
Extended defects as a source of phonon confinement in polycrystalline Si and Ge films
Larisa V. Arapkina, Kirill V. Chizh, Oleg V. Uvarov +9
We present Raman spectroscopy of the polycrystalline Si and Ge films deposited by molecular beam deposition on a dielectric substrate. The Raman study has been made using lasers wi…
Evolution of Ge wetting layers growing on smooth and rough Si (001) surfaces: isolated {105} facets as a kinetic factor of stress relaxation
Larisa V. Arapkina, Kirill V. Chizh, Vladimir P. Dubkov +2
The results of STM and RHEED studies of a thin Ge film grown on the Si/Si(001) epitaxial layers with different surface relief are presented. Process of the partial stress relaxatio…
Influence of the thickness of Si and Ge films deposited on SiN/SiO/Si substrates on their structure and diffusion of hydrogen atoms from SiN layers
Larisa V. Arapkina, Kirill V. Chizh, Dmitry B. Stavrovskii +5
The results of RHEED, FTIR and Raman spectroscopy study of silicon and germanium films with the thickness up to 200 nm grown from molecular beams on dielectric SiN/SiO/…
Diffusion processes in germanium and silicon films grown on SiN substrates
Larisa V. Arapkina, Kirill V. Chizh, Dmitry B. Stavrovskii +3
In this article, the results of investigation of processes occurring during the molecular-beam deposition of germanium layers on SiN dielectric substrates within a wide ran…
Low-temperature formation of platinum silicides on polycrystalline silicon
Kirill V. Chizh, Vladimir P. Dubkov, Vyacheslav M. Senkov +5
Phase formation and transitions in platinum silicide films on polycrystalline Si in the process of Pt magnetron sputtering and heat treatments at different temperatures are studied…
Diffusion of hydrogen atoms in silicon layers deposited from molecular beams on dielectric substrates
Kirill V. Chizh, Larisa V. Arapkina, Dmitry B. Stavrovsky +2
In the paper, the processes occurring during low-temperature growth of non-hydrogenated amorphous Si and polycrystalline Si films on multilayer SiN/SiO/c-Si substrates…