Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy
arXiv:1304.0955
Abstract
Application of the two-wavelength X-ray reflectometry to exploration of Ge/Si(001) hereostructures with dense chains of stacked Ge quantum dots is presented
21st Int. Symp. "Nanostructures: Physics and Technology"; Saint Petersburg, Russia, June 24-28, 2013