Electron-Phonon Scattering in Metallic Single-Walled Carbon Nanotubes

Abstract

Electron scattering rates in metallic single-walled carbon nanotubes are studied using an atomic force microscope as an electrical probe. From the scaling of the resistance of the same nanotube with length in the low and high bias regimes, the mean free paths for both regimes are inferred. The observed scattering rates are consistent with calculations for acoustic phonon scattering at low biases and zone boundary/optical phonon scattering at high biases.

4 pages, 5 figures

References in corpus (3)

• Electrical Nanoprobing of Semiconducting Carbon Nanotubes using an Atomic Force Microscope
• Acoustic phonon exchange, attractive interactions, and the Wentzel-Bardeen singularity in single-wall nanotubes
• The Phonon Drag Effect in Single-Walled Carbon Nanotubes

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