Scanned Probe Microscopy of Electronic Transport in Carbon Nanotubes
arXiv:cond-mat/0002209 · doi:10.1103/PhysRevLett.84.6082
Abstract
We use electrostatic force microscopy and scanned gate microscopy to probe the conducting properties of carbon nanotubes at room temperature. Multi-walled carbon nanotubes are shown to be diffusive conductors, while metallic single-walled carbon nanotubes are ballistic conductors over micron lengths. Semiconducting single-walled carbon nanotubes are shown to have a series of large barriers to conduction along their length. These measurements are also used to probe the contact resistance and locate breaks in carbon nanotube circuits.
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