paper

Robust Aluminum Nitride Passivation of Silicon Carbide with Near-Surface Quantum Emitters for Quantum Computing and Sensing Applications

arXiv:2412.11873 · doi:10.1021/acsanm.5c05636

Abstract

Silicon carbide (SiC) hosts a number of point defects that are being explored as single-photon emitters for quantum applications. Unfortunately, these quantum emitters lose their photostability when placed in proximity to the surface of the host semiconductor. In principle, a uniform passivation of the surface's dangling bonds by simple adsorbates, such as hydrogen or mixed hydrogen/hydroxyl groups, should remove detrimental surface effects. However, the usefulness of atomic and molecular passivation schemes is limited by their lack of long-term chemical and/or thermal stability. In this first principles work, we use aluminum nitride (AlN) to passivate SiC surfaces in a core-shell nanowire model. By using a negatively charged silicon vacancy in SiC as the proof-of-principle quantum emitter, we show that AlN-passivation is effective in removing SiC surface states from the band gap and in restoring the defect's optical properties. We also report the existence of a silicon vacancy-based defect at the SiC-AlN interface, which displays distinct spin and optical properties as compared to the other well-studied defects in SiC.

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