Defect-Moderated Oxidative Etching of MoS2
arXiv:1906.04850 · doi:10.1063/1.5115036
Abstract
We report a simple technique for the selective etching of bilayer and monolayer MoS. In this work, chosen regions of MoS were activated for oxygen adsorption and reaction by the application of low doses of He at 30 keV in a gas ion microscope. Raman spectroscopy, optical microscopy and scanning electron microscopy were used to characterize both the etched features and the remaining material. It has been found that by using a pre-treatment to introduce defects, MoS can be etched very efficiently and with high region specificity by heating in air.
8 pages, 6 figures