Robust valley polarization of helium ion modified atomically thin MoS
arXiv:1705.01375 · doi:10.1088/2053-1583/aa9642
Abstract
Atomically thin semiconductors have dimensions that are commensurate with critical feature sizes of future optoelectronic devices defined using electron/ion beam lithography. Robustness of their emergent optical and valleytronic properties is essential for typical exposure doses used during fabrication. Here, we explore how focused helium ion bombardment affects the intrinsic vibrational, luminescence and valleytronic properties of atomically thin MoS. By probing the disorder dependent vibrational response we deduce the interdefect distance by applying a phonon confinement model. We show that the increasing interdefect distance correlates with disorder-related luminescence arising 180 meV below the neutral exciton emission. We perform ab-initio density functional theory of a variety of defect related morphologies, which yield first indications on the origin of the observed additional luminescence. Remarkably, no significant reduction of free exciton valley polarization is observed until the interdefect distance approaches a few nanometers, namely the size of the free exciton Bohr radius. Our findings pave the way for direct writing of sub-10 nm nanoscale valleytronic devices and circuits using focused helium ions.
arXiv comment9 pages, 5 figures
References in corpus (14)
- Atomically thin MoS2: A new direct-gap semiconductor
- Control of valley polarization in monolayer MoS2 by optical helicity
- Valley polarization in MoS2 monolayers by optical pumping
- MoS_2 as an ideal material for valleytronics: valley-selective circular dichroism and valley Hall effect
- Exciton Binding Energy and Nonhydrogenic Rydberg Series in Monolayer WS2
- Local strain engineering in atomically thin MoS2
- Strong Photoluminescence Enhancement of MoS2 through Defect Engineering and Oxygen Bonding
- Two-dimensional transition metal dichalcogenides under electron irradiation: defect production and doping
- Symmetry-dependent phonon renormalization in monolayer MoS2 transistor
- Low-temperature photocarrier dynamics in monolayer MoS2
- Carrier and polarization dynamics in monolayer MoS2
- Defect-induced conductivity anisotropy in MoS2 monolayers
- Photogating of mono- and few-layer MoS2
- Ultra-low power threshold for laser induced changes in optical properties of 2D Molybdenum dichalcogenides
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