Ultra-Sensitive Extinction Measurements of Optically Active Defects in Monolayer MoS
arXiv:2212.10231 · doi:10.1021/acs.jpclett.2c02386
Abstract
We utilize cavity-enhanced extinction spectroscopy to directly quantify the optical absorption of defects in MoS generated by helium ion bombardment. We achieve hyperspectral imaging of specific defect patterns with a detection limit below 0.01% extinction, corresponding to a detectable defect density below cm. The corresponding spectra reveal a broad sub-gap absorption, being consistent with theoretical predictions related to sulfur vacancy-bound excitons in MoS. Our results highlight cavity-enhanced extinction spectroscopy as efficient means for the detection of optical transitions in nanoscale thin films with weak absorption, applicable to a broad range of materials.
17 pages main manuscript, 7 pages supporting information
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