Micro-reflectance and transmittance spectroscopy: a versatile and powerful tool to characterize 2D materials

Abstract

Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques to study 2D materials. However, a thorough description of the experimental setups needed to carry out these measurements is lacking in the literature. We describe a versatile optical microscope setup to carry out differential reflectance and transmittance spectroscopy in 2D materials with a lateral resolution of ~1 micron in the visible and near-infrared part of the spectrum. We demonstrate the potential of the presented setup to determine the number of layers of 2D materials and to characterize their fundamental optical properties such as excitonic resonances. We illustrate its performance by studying mechanically exfoliated and chemical vapor-deposited transition metal dichalcogenide samples.

arXiv comment5 main text figures + 1 table with all the part numbers to replicate the experimental setup + 4 supp. info. figures

References in corpus (19)

• Electric Field Effect in Atomically Thin Carbon Films
• Atomically thin MoS2: A new direct-gap semiconductor
• The Raman Fingerprint of Graphene
• Anomalous Lattice Vibrations of Single and Few-Layer MoS2
• Control of valley polarization in monolayer MoS2 by optical helicity
• Valley polarization in MoS2 monolayers by optical pumping
• Observation of tightly bound trions in monolayer MoS2
• Exciton Binding Energy and Nonhydrogenic Rydberg Series in Monolayer WS2
• Evolution of Electronic Structure in Atomically Thin Sheets of WS2 and WSe2
• Making graphene visible
• Optical Spectrum of MoS${}_2$: Many-body Effects and Diversity of Exciton States
• Optical Generation of Excitonic Valley Coherence in Monolayer WSe2
• Low-temperature photocarrier dynamics in monolayer MoS2
• Photocarrier relaxation in two-dimensional semiconductors
• Probing excitonic states in ultraclean suspended two-dimensional semiconductors by photocurrent spectroscopy
• Optical identification of atomically thin dichalcogenide crystals
• Visibility of graphene flakes on a dielectric substrate
• Spatially resolved optical absorption spectroscopy of single- and few-layer MoS2 by hyperspectral imaging
• Light-Matter Interactions in Two-Dimensional Transition Metal Dichalcogenides: Dominant Excitonic Transitions in mono- and few-layer MoX${}_2$ and Band Nesting

Cited by in corpus (39)

• Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2
• A strain tunable single-layer MoS2 photodetector
• Moiré Intralayer Excitons in a MoSe${}_2$/MoS${}_2$ Heterostructure
• Strain engineering in single-, bi- and tri-layer MoS2, MoSe2, WS2 and WSe2
• Polarization-sensitive and broadband photodetection based on a mixed-dimensionality TiS3/Si p-n junction
• In-plane anisotropic optical and mechanical properties of two-dimensional MoO${}_3$
• Biaxial versus uniaxial strain tuning of single-layer MoS${}_2$
• Characterization of highly crystalline lead iodide nanosheets prepared by room-temperature solution processing
• MoS${}_2$-on-paper optoelectronics: drawing photodetectors with van der Waals semiconductors beyond graphite
• Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials
• Large birefringence and linear dichroism in TiS3 nanosheets
• The optical properties of few-layer InSe
• Microheater actuators as a versatile platform for strain engineering in 2D materials
• Excitonic Resonance Effects and Davydov Splitting in Circularly Polarized Raman Spectra of Few-Layer WSe2
• Stacking-Dependent Optical Properties in Bilayer WSe2
• Strongly anisotropic strain-tunability of excitons in exfoliated ZrSe${}_3$
• Optical contrast and refractive index of natural van der Waals heterostructure nanosheets of franckeite
• Observation of bright and dark exciton transitions in monolayer MoSe2 by photocurrent spectroscopy
• Strong Modulation of Optical Properties in Rippled 2D GaSe via Strain Engineering
• Biaxial strain tuning of interlayer excitons in bilayer MoS2
• Thickness identification of thin InSe by optical microscopy methods
• Symmetry breakdown in franckeite: spontaneous strain, rippling and interlayer moiré
• Optical-based thickness measurement of MoO${}_3$ nanosheets
• Twist-dependent intra- and interlayer excitons in moire MoSe2 homobilayers
• Excitonic signatures of ferroelectric order in parallel-stacked MoS${}_2$
• High Throughput Characterization of Epitaxially Grown Single-Layer MoS2
• Strain Engineering of Magnetoresistance and Magnetic Anisotropy in CrSBr
• Multidimensional Analysis of Excitonic Spectra of Monolayers of Tungsten Disulphide: Towards Computer Aided Identification of Structural and Environmental Perturbations of 2D Materials
• Optical microscopy-based thickness estimation in thin GaSe flakes
• High harmonic generation in monolayer MoS2 controlled by resonant and near-resonant pulses on ultrashort time scales
• Rapid multiplex ultrafast nonlinear microscopy for material characterization
• Reliable and Broad-range Layer Identification of Au-assisted Exfoliated Large Area MoS${}_2$ and WS${}_2$ Using Reflection Spectroscopic Fingerprints
• Algorithm for Reproducible Analysis of Semiconducting 2D Nanomaterials Based on UV/VIS Spectroscopy
• Lithography-free electrical transport measurements on 2D materials by direct microprobing
• Thermal difference reflectivity of tilted 2D Dirac materials
• Photodiodes based in La0.7Sr0.3MnO3/single layer MoS2 hybrid vertical heterostructures
• Quantifying colors at micrometer scale by colorimetric microscopy (C-Microscopy) approach
• Isolation and characterization of atomically thin mica phyllosilicates
• Dielectric permittivity tensor dynamics of in-plane hyperbolic van der Waals MoOCl2 and emergent chiral photonic applications