Polarization-sensitive and broadband photodetection based on a mixed-dimensionality TiS3/Si p-n junction

Abstract

The capability to detect the polarization state of light is crucial in many day-life applications and scientific disciplines. Novel anisotropic two-dimensional materials such as TiS3 combine polarization sensitivity, given by the in-plane optical anisotropy, with excellent electrical properties. Here we demonstrate the fabrication of a monolithic polarization sensitive broadband photodetector based on a mixed-dimensionality TiS3/Si p-n junction. The fabricated devices show broadband responsivity up to 1050 nm, a strong sensitivity to linearly polarized illumination with difference between the two orthogonal polarization states up to 350 % and a good detectivity and fast response time. The discussed devices can be used as building blocks to fabricate more complex polarization sensitive systems such as polarimeters.

arXiv comment6 main text figures, 1 figure. Includes the supporting information (18 supp. info. figures)

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Cited by in corpus (2)

• Polarization-sensitive and broadband photodetection based on a mixed-dimensionality TiS3/Si p-n junction
• In-plane anisotropic optical and mechanical properties of two-dimensional MoO${}_3$