Ferroelectric Domain Patterning Controlled Schottky Junction State in Monolayer MoS
arXiv:1606.01322 · doi:10.1103/PhysRevLett.118.236801
Abstract
We exploit scanning probe controlled domain patterning in a ferroelectric top layer to induce nonvolatile modulation of the conduction characteristic of monolayer MoS between a transistor and a junction state. In the presence of a domain wall, MoS exhibits rectified I-V that is well described by the thermionic emission model. The induced Schottky barrier height varies from 0.38 eV to 0.57 eV and is tunabe by a SiO global back-gate, while the tuning range of depends sensitively on the conduction band tail trapping states. Our work points to a new route to achieving programmable functionalities in van der Waals materials and sheds light on the critical performance limiting factors in these hybrid systems.
arXiv comment18 pages, 4 figures
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