Comparison of the luminous efficiency of Ga- and N-polar InGaN/InGaN quantum wells grown by plasma-assisted molecular beam epitaxy
arXiv:1510.06512 · doi:10.1103/PhysRevApplied.6.034017
Abstract
We investigate the luminescence of Ga- and N-polar InGaN/InGaN quantum wells (QWs) grown by plasma-assisted molecular beam epitaxy on freestanding GaN as well as 6H-SiC substrates. In striking contrast to their Ga-polar counterparts, the N-polar QWs prepared on freestanding GaN do not exhibit any detectable photoluminescence. Theoretical simulations of the band profiles combined with resonant excitation of the QWs allow us to rule out carrier escape and subsequent surface recombination as the reason for the absence of luminescence. To explore the hypothesis of a high concentration of nonradiative defects at the interfaces between wells and barriers, we analyze Ga- and N-polar QWs prepared on 6H-SiC as a function of the well width. Intense luminescence is observed for both Ga- and N polar samples. As expected, the luminescence of the Ga-polar QWs quenches and red-shifts with increasing well width due to the quantum confined Stark effect. In contrast, both the intensity and the energy of the luminescence from the N-polar samples are essentially independent of well width. Transmission electron microscopy reveals that the N-polar QWs exhibit abrupt interfaces and homogeneous composition, excluding emission from In-rich clusters as the reason for this anomalous behavior. The microscopic origin of the luminescence in the N-polar QWs is elucidated using spatially resolved cathodoluminescence spectroscopy. Regardless of well width, the luminescence is found to not originate from the N-polar QWs, but from the semipolar facets of v-pit defects. These results cast serious doubts on the potential of N-polar QWs grown by plasma-assisted molecular beam epitaxy for the development of long-wavelength light emitting diodes. What remains to be seen is whether unconventional growth conditions may enable a significant reduction in the concentration of nonradiative defects.
arXiv comment12 pages, 10 figures
References in corpus (8)
- Non-linear macroscopic polarization in III-V nitride alloys
- X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films
- A growth diagram for plasma-assisted molecular beam epitaxy of GaN nanocolumns on Si(111)
- Spontaneous nucleation and growth of GaN nanowires: Fundamental role of crystal polarity
- Self-regulated radius of spontaneously formed GaN nanowires in molecular beam epitaxy
- Coexistence of quantum-confined Stark effect and localized states in an (In,Ga)N/GaN nanowire heterostructure
- Correlation between In content and emission wavelength of InGaN/GaN nanowire heterostructures
- Localization and defects in axial (In,Ga)N/GaN nanowire heterostructures investigated by spatially-resolved luminescence spectroscopy
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