Robust formation of skyrmions and topological Hall effect in epitaxial thin films of MnSi

Abstract

Magneto-transport properties have been investigated for epitaxial thin films of B20-type MnSi grown on Si(111) substrates. Both Lorentz transmission electron microscopy (TEM) images and topological Hall effect (THE) clearly point to the robust formation of skyrmions over a wide temperature-magnetic field region. New features distinct from those of bulk MnSi are observed for epitaxial MnSi films: a shorter (nearly half) period of the spin helix and skyrmions, and an opposite sign of THE. These observations suggest versatile features of skyrmion-induced THE beyond the current understanding.

References in corpus (4)

• Skyrmions and Anomalous Hall Effect in a Dzyloshinskii-Moriya Spiral Magnet
• A hidden constant in the anomalous Hall effect of a high-purity magnet MnSi
• Extended elliptic skyrmion gratings in epitaxial MnSi thin films
• Efficient current-induced domain-wall displacement SrRuO3

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