Dirac cone shift of a passivated topological Bi2Se3 interface state
arXiv:1208.3881 · doi:10.1103/PhysRevB.87.155126
Abstract
Gated terahertz cyclotron resonance measurements on epitaxial Bi2Se3 thin films capped with In2Se3 enable the first spectroscopic characterization of a single topological interface state from the vicinity of the Dirac point to above the conduction band edge. A precipitous drop in the scattering rate with Fermi energy is observed that is interpreted as the surface state decoupling from bulk states and evidence of a shift of the Dirac point towards mid-gap. Near the Dirac point, potential fluctuations of 50 meV are deduced from an observed loss of differential optical spectral weight near the Dirac point. Potential fluctuations are reduced by a factor of two at higher surface Fermi levels in the vicinity of the conduction band edge inferred from the width of the scattering rate step. The passivated topological interface state attains a high mobility of 3500 cm2/Vsec near the Dirac point.
12 Pages, 6 figures
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- Gate-tunable transport properties of in-situ capped BiTe topological insulator thin films
- Gate-Variable Mid-Infrared Optical Transitions in a Topological Insulator
- Observation of Ultrahigh Mobility Surface States in a Topological Crystalline Insulator by Infrared Spectroscopy
- Strong interband Faraday rotation in 3D topological insulator Bi2Se3
- Modeling Near-Surface Bound Electron States in Three-Dimensional Topological Insulator: Analytical and Numerical Approaches
- Band bending at the surface of BiSe studied from first principles
- Optical investigation of thermoelectric topological crystalline insulator PbSnSe
- Josephson Effect and Charge Distribution in Thin BiTe Topological Insulators
- Resonant Faraday and Kerr effects due to in-gap states on the surface of a topological insulator
- Cyclotron Resonance in Topological Insulators: Non-Relativistic Effects
- A new type of cyclotron resonance from charge-impurity scattering in the bulk-insulating BiSe thin films
- Large Enhancement of Electronic Thermal Conductivity and Lorenz Number in Topological Insulator Bi2Te2Se Thin Films