Randomized benchmarking and process tomography for gate errors in a solid-state qubit

Abstract

We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double pi pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1+/-0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.

4 pages, 4 figures, plus supplementary material

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Cited by in corpus (5)

• Demonstration of Two-Qubit Algorithms with a Superconducting Quantum Processor
• Simple pulses for elimination of leakage in weakly nonlinear qubits
• Life after charge noise: recent results with transmon qubits
• Dynamics of dispersive single qubit read-out in circuit quantum electrodynamics
• Time-optimal performance of Josephson charge qubits: A process tomography approach