General error mitigation for quantum circuits

Abstract

A general method to mitigate the effect of errors in quantum circuits is outlined. The method is developed in sight of characteristics that an ideal method should possess and to ameliorate an existing method which only mitigates state preparation and measurement errors. The method is tested on different IBM Q quantum devices, using randomly generated circuits with up to four qubits. A large majority of results show significant error mitigation.

References in corpus (2)

• Randomized benchmarking and process tomography for gate errors in a solid-state qubit
• Quantum process tomography and Linblad estimation of a solid state qubit