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STMicroelectronics (Italy)

Italy

37 papers here888 citations across 37
fields
  • physics.app-ph11
  • cs.CV5
  • cond-mat.mtrl-sci4
  • cs.LG4
  • physics.ins-det3
  • eess.SY2
  • cond-mat.stat-mech1
  • cs.AR1
ROR 053bqv655OpenAlex

affiliations via OpenAlex

output
20022025
most citedAb initio calculations of electron affinity and ionization potential of carbon nanotubes

86 citations

researchers with a paper here
  • F. Roccaforte11 · h 49
  • F. Giannazzo8 · h 49
  • P. Fiorenza8 · h 32
  • C. Bongiorno6 · h 43
  • M. Saggio6 · h 20
  • G. Boracchi4 · h 26
  • G. Greco4 · h 34
  • M. Vivona4 · h 18
  • A. Alberti3 · h 28
  • A. Calimera3 · h 21
  • A. La Magna3 · h 26
  • B. Rossi3 · h 13
collaborating institutions
  • Institute for Microelectronics and MicrosystemsIT15 papers
  • Politecnico di MilanoIT6 papers
  • STMicroelectronics (Czechia)CZ4 papers
  • STMicroelectronics (Switzerland)CH4 papers
  • Politecnico di TorinoIT3 papers
  • University of BolognaIT3 papers
  • University of UdineIT3 papers
  • Centre National de la Recherche ScientifiqueFR2 papers
  • University of CataniaIT2 papers
  • University of MessinaIT2 papers
  • University of Milano-BicoccaIT2 papers
  • University of PalermoIT2 papers
Showing 2017Show all

1 paper · 1 filter

cond-mat.mtrl-sci2017★ 75 cited

Structural, Chemical and Optical Properties of Cerium Dioxide Film Prepared by Atomic Layer Deposition on TiN and Si Substrates

S. Vangelista, R. Piagge, S. Ek +4

Thin films of cerium dioxide (CeO2) were deposited by atomic layer deposition (ALD) at 250 °C on both Si and TiN substrates. The ALD growth produces CeO2 films with polycrystalline…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.