activity
20052020
most citedMorphological and electrical properties of Nickel based Ohmic contacts formed by laser annealing process on n-type 4H-SiC

44 citations · 94 across the 5 of their papers we have counts for

collaborators

5 papers

physics.app-ph2020★ 18 cited

Inter-diffusion, melting and reaction interplay in Ni/4H-SiC under excimer laser annealing

Salvatore Sanzaro, Corrado Bongiorno, Paolo Badalà +5

We investigated the complex interaction between a nickel layer and a 4H-SiC substrate under UV-laser irradiation since the early stages of the atomic inter-diffusion. An exhaustive…

cond-mat.mtrl-sci2020★ 10 cited

Simulation of the growth kinetics in group IV compound semiconductors

A. La Magna, A. Alberti, E. Barbagiovanni +5

We present a stochastic simulation method designed to study at an atomic resolution the growth kinetics of compounds characterized by the sp3-type bonding symmetry. Formalization a…

physics.app-ph2019★ 22 cited

Properties of Al2O3 thin films deposited on 4H-SiC by reactive ion sputtering

P. Fiorenza, M. Vivona, S. Di Franco +5

In this work, the electrical properties of Al2O3 films deposited by reactive ion sputtering were investigated by means of morphological, chemical and electrical characterizations.…

physics.app-ph2019★ 44 cited

Morphological and electrical properties of Nickel based Ohmic contacts formed by laser annealing process on n-type 4H-SiC

S. Rascunà, P. Badalà, C. Tringali +8

This work reports on the morphological and electrical properties of Ni-based back-side Ohmic contacts formed by laser annealing process for SiC power diodes. Nickel films, 100 nm t…

cond-mat.mtrl-sci2005

Pseudoepitaxial transrotational structures in 14 nm-thick NiSi layers on [001] silicon

Alessandra Alberti, Corrado Bongiorno, Brunella Cafra +6

In a system consisting of two different lattices, the structural stability is ensured when an epitaxial relationship occurs between them and allows the system to retain the stress,…