Gain Dependence of the Noise in the Single Electron Transistor

Abstract

An extensive investigation of low frequency noise in single electron transistors as a function of gain is presented. Comparing the output noise with gain for a large number of bias points, it is found that the noise is dominated by external charge noise. For low gains we find an additional noise contribution which is compared to a model including resistance fluctuations. We conclude that this excess noise is not only due to resistance fluctuations. For one sample, we find a record low minimum charge noise of qn = 9*10^-6 e/sqrt(Hz) in the superconducting state and qn = 9*10^-6 e/sqrt(Hz) in the normal state at a frequency of 4.4 kHz.

arXiv comment10 pages, LaTex 2.09, 4 figures (epsfig)

References in corpus (2)

• Noise in Al single electron transistors of stacked design
• Bias and temperature dependence of the noise in a single electron transistor

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