Unexpected Scaling of the Performance of Carbon Nanotube Transistors
arXiv:cond-mat/0302175 · doi:10.1103/PhysRevB.68.235418
Abstract
We show that carbon nanotube transistors exhibit scaling that is qualitatively different than conventional transistors. The performance depends in an unexpected way on both the thickness and the dielectric constant of the gate oxide. Experimental measurements and theoretical calculations provide a consistent understanding of the scaling, which reflects the very different device physics of a Schottky barrier transistor with a quasi-one-dimensional channel contacting a sharp edge. A simple analytic model gives explicit scaling expressions for key device parameters such as subthreshold slope, turn-on voltage, and transconductance.
4 pages, 4 figures
References in corpus (5)
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- Complementary-like Graphene Logic Gates Controlled by Electrostatic Doping
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- Analytical Model of One-Dimensional Ballistic Schottky-Barrier Transistors
- Ultrastrong coupling between electron tunneling and mechanical motion
- Trion-based High-speed Electroluminescence from Semiconducting Carbon Nanotube Films
- Statistical Analysis of Contacts to Synthetic Monolayer MoS2
- Drain Current Model of One-Dimensional Ballistic Reconfigurable Transistors
- Efficient narrow-band light emission from a single carbon nanotube p-n diode