Utilizing multimodal microscopy to reconstruct Si/SiGe interfacial atomic disorder and infer its impacts on qubit variability
arXiv:2306.15646 · doi:10.1038/s41534-024-00827-8
Abstract
SiGe heteroepitaxial growth yields pristine host material for quantum dot qubits, but residual interface disorder can lead to qubit-to-qubit variability that might pose an obstacle to reliable SiGe-based quantum computing. We demonstrate a technique to reconstruct 3D interfacial atomic structure spanning multiqubit areas by combining data from two verifiably atomic-resolution microscopy techniques. Utilizing scanning tunneling microscopy (STM) to track molecular beam epitaxy (MBE) growth, we image surface atomic structure following deposition of each heterostructure layer revealing nanosized SiGe undulations, disordered strained-Si atomic steps, and nonconformal uncorrelated roughness between interfaces. Since phenomena such as atomic intermixing during subsequent overgrowth inevitably modify interfaces, we measure post-growth structure via cross-sectional high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM). Features such as nanosized roughness remain intact, but atomic step structure is indiscernible in ~nm-wide intermixing at interfaces. Convolving STM and HAADF-STEM data yields 3D structures capturing interface roughness and intermixing. We utilize the structures in an atomistic multivalley effective mass theory to quantify qubit spectral variability. The results indicate (1) appreciable valley splitting (VS) variability of roughly owing to alloy disorder, and (2) roughness-induced double-dot detuning bias energy variability of order meV depending on well thickness. For measured intermixing, atomic steps have negligible influence on VS, and uncorrelated roughness causes spatially fluctuating energy biases in double-dot detunings potentially incorrectly attributed to charge disorder.
12 pages, 6 figures
References in corpus (6)
- Scalable gate architecture for densely packed semiconductor spin qubits
- A Reconfigurable Gate Architecture for Si/SiGe Quantum Dots
- Measurement of valley splitting in high-symmetry Si/SiGe quantum dots
- Si/SiGe QuBus for single electron information-processing devices with memory and micron-scale connectivity function
- Enhancement-mode buried strained silicon channel quantum dot with tunable lateral geometry
- Heterogeneous nucleation of pits via step pinning during Si(100) homoepitaxy
Cited by in corpus (6)
- Atomistic compositional details and their importance for spin qubits in isotope-purified silicon-germanium quantum wells
- Theory of Valley Splitting in Si/SiGe Spin-Qubits: Interplay of Strain, Resonances and Random Alloy Disorder
- Leveraging Off-the-Shelf Silicon Chips for Quantum Computing
- Variability of hole spin qubits in planar Germanium
- Omnidirectional shuttling to avoid valley excitations in Si/SiGe quantum wells
- Towards Utilizing Scanning Gate Microscopy as a High-Resolution Probe of Valley Splitting in Si/SiGe Heterostructures