Dispersively probed microwave spectroscopy of a silicon hole double quantum dot
arXiv:2012.15588 · doi:10.1103/PhysRevApplied.16.034031
Abstract
Owing to ever increasing gate fidelities and to a potential transferability to industrial CMOS technology, silicon spin qubits have become a compelling option in the strive for quantum computation. In a scalable architecture, each spin qubit will have to be finely tuned and its operating conditions accurately determined. In this prospect, spectroscopic tools compatible with a scalable device layout are of primary importance. Here we report a two-tone spectroscopy technique providing access to the spin-dependent energy-level spectrum of a hole double quantum dot defined in a split-gate silicon device. A first GHz-frequency tone drives electric-dipole spin resonance enabled by the valence-band spin-orbit coupling. A second lower-frequency tone (approximately 500 MHz) allows for dispersive readout via rf-gate reflectometry. We compare the measured dispersive response to the linear response calculated in an extended Jaynes-Cummings model and we obtain characteristic parameters such as g-factors and tunnel/spin-orbit couplings for both even and odd occupation.
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- Electrical operation of hole spin qubits in planar MOS silicon quantum dots
- Coupling of hole double quantum dot in planar germanium to a microwave cavity
- Combining n-MOS Charge Sensing with p-MOS Silicon Hole Double Quantum Dots in a CMOS platform
- Gate reflectometry in dense quantum dot arrays
- Gate-based spin readout of hole quantum dots with site-dependent factors
- Dynamical charge susceptibility in nonequilibrium double quantum dots
- Parametric longitudinal coupling of a semiconductor charge qubit and a RF resonator
- Flux-Tunable Hybridization in a Double Quantum Dot Interferometer
- Quantification of the heavy-hole--light-hole mixing in two-dimensional hole gases