Thermal-error regime in high-accuracy gigahertz single-electron pumping
arXiv:1703.04795 · doi:10.1103/PhysRevApplied.8.044021
Abstract
Single-electron pumps based on semiconductor quantum dots are promising candidates for the emerging quantum standard of electrical current. They can transfer discrete charges with part-per-million (ppm) precision in nanosecond time scales. Here, we employ a metal-oxide-semiconductor silicon quantum dot to experimentally demonstrate high-accuracy gigahertz single-electron pumping in the regime where the number of electrons trapped in the dot is determined by the thermal distribution in the reservoir leads. In a measurement with traceability to primary voltage and resistance standards, the averaged pump current over the quantized plateau, driven by a \mbox{-GHz} sinusoidal wave in the absence of magnetic field, is equal to the ideal value of within a measurement uncertainty as low as ~ppm.
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