Field emission from single and few-layer graphene flakes
arXiv:1102.3273 · doi:10.1063/1.3579533
Abstract
We report the observation and characterization of field emission current from individual single- and few-layer graphene flakes laid on a flat SiO2/Si substrate. Measurements were performed in a scanning electron microscope chamber equipped with nanoprobes, used as electrodes to realize local measurements of the field emission current. We achieved field emission currents up to 1 μA from the flat part of graphene flakes at applied fields of few hundred V/μm. We found that emission process is stable over a period of several hours and that it is well described by a Fowler-Nordheim model for currents over 5 orders of magnitude.
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- Field emission from two-dimensional GeAs
- General form of the tunnelling barrier for nanometrically sharp electron emitters
- A memristive model for graphene emitters: hysteresis and self-crossing