most citedDetection of Single Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic Force Microscopy

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cond-mat.mtrl-sci2005★ 119 cited

Detection of Single Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic Force Microscopy

Romain Stomp, Yoichi Miyahara, Sacha Schaer +6

Single electron charging in an individual InAs quantum dot was observed by electrostatic force measurements with an atomic force microscope (AFM). The resonant frequency shift and…