119 citations
2 papers
cond-mat.mtrl-sci2005★ 119 cited
Detection of Single Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic Force Microscopy
Romain Stomp, Yoichi Miyahara, Sacha Schaer +6
Single electron charging in an individual InAs quantum dot was observed by electrostatic force measurements with an atomic force microscope (AFM). The resonant frequency shift and…
cond-mat.str-el2004★ 24 cited
Spin and Valley dependent analysis of the two-dimensional low-density electron system in Si-MOSFETS
M. W. C. Dharma-wardana, François Perrot
The 2-D electron system (2DES) in Si metal-oxide field-effect transistors (MOSFETS) consists of two distinct electron fluids interacting with each other. We calculate the total ene…