253 citations · 1.6k across the 38 of their papers we have counts for
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Wafer-Scale Characterization of a Superconductor Integrated Circuit Fabrication Process, Using a Cryogenic Wafer Prober
Joshua T. West, Arthur Kurlej, Alex Wynn +3
Using a fully automated cryogenic wafer prober, we measured superconductor fabrication process control monitors and simple integrated circuits on 200 mm wafers at 4.4 K, including…
Mutual and self-inductance in planarized multilayered superconductor integrated circuits: Microstrips, striplines, bends, meanders, ground plane perforations
Sergey K. Tolpygo, Evan B. Golden, Terence J. Weir +1
Data are presented on mutual and self-inductance of various inductors used in multilayered superconductor integrated circuits: microstrips and striplines with widths of signal trac…
A new family of bioSFQ logic/memory cells
Vasili K. Semenov, Evan B. Golden, Sergey K. Tolpygo
Superconductor electronics (SCE) is competing to become a platform for efficient implementations of neuromorphic computing and deep learning algorithms (DLAs) with projects mostly…
Inductance and mutual inductance of superconductor integrated circuit features with sizes down to 120 nm. Part I
Sergey. K. Tolpygo, Evan B. Golden, Terence J. Weir +1
Data are presented on inductance of various features used in superconductor digital integrated circuits such as microstrip and stripline inductors with linewidths down to 120 nm an…