activity
20202025
most citedCompact modeling technology for the simulation of integrated circuits based on graphene field-effect transistors

42 citations · 229 across the 23 of their papers we have counts for

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Showing 2020Show all

6 papers · 1 filter

cond-mat.mes-hall2020★ 4 cited

Contact resistance assessment and high-frequency performance projection of black phosphorus field-effect transistor technologies

Leslie M. Valdez-Sandoval, Eloy Ramirez-Garcia, David Jiménez +1

In this work, an evaluation of the contact quality of black phosphorus (BP) field-effect transistors (FETs) from different technologies previously reported is performed by means of…

physics.app-ph2020★ 9 cited

Small-signal parameters extraction and noise analysis of CNTFETs

Javier N. Ramos-Silva, Aníbal Pacheco-Sánchez, Mauro A. Enciso-Aguilar +2

The use of carbon nanotube (CNT) field-effect transistors (FETs) in microwave circuit design requires an appropriate, immediate and efficient description of their performance. This…

physics.app-ph2020★ 18 cited

A small-signal GFET equivalent circuit considering an explicit contribution of contact resistances

Anibal Pacheco-Sanchez, Javier N. Ramos-Silva, Eloy Ramirez-Garcia +1

A small-signal equivalent circuit for graphene field-effect transistors is proposed considering the explicit contribution of effects at the metal-graphene interfaces by means of co…

cond-mat.mes-hall2020★ 23 cited

Experimental observation and modeling of the impact of traps on static and analog/HF performance of graphene transistors

Anibal Pacheco-Sanchez, Nikolaos Mavredakis, Pedro C. Feijoo +4

The trap-induced hysteresis on the performance of a graphene field-effect transistor is experimentally diminished here by applying consecutive gate-to-source voltage pulses of oppo…

physics.app-ph2020★ 8 cited

Accuracy of Y-function methods for parameters extraction of two-dimensional FETs across different technologies

Anibal Pacheco-Sanchez, David Jiménez

The accuracy of contact resistance values of two-dimensional field-effect transistors extracted with the \textit{Y}-function considering the impact of the intrinsic mobility degrad…

physics.app-ph2020★ 16 cited

Contact resistance extraction of graphene FET technologies based on individual device characterization

Anibal Pacheco-Sanchez, Pedro C. Feijoo, David Jiménez

Straightforward contact resistance extraction methods based on electrical device characteristics are described and applied here to graphene field-effect transistors from different…