Low-energy Calibration of XENON1T with an Internal Ar Source
arXiv:2211.14191 · doi:10.1140/epjc/s10052-023-11512-z
Abstract
A low-energy electronic recoil calibration of XENON1T, a dual-phase xenon time projection chamber, with an internal Ar source was performed. This calibration source features a 35-day half-life and provides two mono-energetic lines at 2.82 keV and 0.27 keV. The photon yield and electron yield at 2.82 keV are measured to be (32.30.3) photons/keV and (40.60.5) electrons/keV, respectively, in agreement with other measurements and with NEST predictions. The electron yield at 0.27 keV is also measured and it is (68.0) electrons/keV. The Ar calibration confirms that the detector is well-understood in the energy region close to the detection threshold, with the 2.82 keV line reconstructed at (2.830.02) keV, which further validates the model used to interpret the low-energy electronic recoil excess previously reported by XENON1T. The ability to efficiently remove argon with cryogenic distillation after the calibration proves that Ar can be considered as a regular calibration source for multi-tonne xenon detectors.
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