Gate voltage dependence of noise distribution in radio-frequency reflectometry in gallium arsenide quantum dots

Abstract

We investigate gate voltage dependence of electrical readout noise in high-speed rf reflectometry using gallium arsenide quantum dots. The fast Fourier transform spectrum from the real time measurement reflects build-in device noise and circuit noise including the resonator and the amplifier. We separate their noise spectral components by model analysis. Detail of gate voltage dependence of the flicker noise is investigated and compared to the charge sensor sensitivity. We point out that the dominant component of the readout noise changes by the measurement integration time.

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Cited by in corpus (5)

• Radio-frequency reflectometry in bilayer graphene devices utilizing micro graphite back-gates
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• Visual explanations of machine learning model estimating charge states in quantum dots
• Dynamics of quantum cellular automata electron transition in triple quantum dots
• Charge state estimation in quantum dots using a Bayesian approach