Absence of magnetic-proximity effect at the interface of Bi${}_2$Se${}_3$ and (Bi,Sb)${}_2$Te${}_3$ with EuS

Abstract

We performed x-ray magnetic circular dichroism (XMCD) measurements on heterostructures comprising topological insulators (TIs) of the (Bi,Sb)${}_2$(Se,Te)${}_3$ family and the magnetic insulator EuS. XMCD measurements allow us to investigate element-selective magnetic proximity effects at the very TI/EuS interface. A systematic analysis reveals that there is neither significant induced magnetism within the TI nor an enhancement of the Eu magnetic moment at such interface. The induced magnetic moments in Bi, Sb, Te, and Se sites are lower than the estimated detection limit of the XMCD measurements of $\sim 10^{-3}$ ${\mu }_{\mathrm{B}}$/at.

7 pages, 3 figures, published in Physical Review Letters

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• Experimental demonstration of a magnetically induced warping transition in a topological insulator mediated by rare-earth surface dopants
• Finite temperature fluctuation-induced order and responses in magnetic topological insulators
• Topological Insulators-Based Magnetic Heterostructure
• Search for enhanced magnetism at the interface between Bi${}_2$Se${}_3$ and EuSe
• Epitaxial growth and magnetic characterization of EuSe thin films with various crystalline orientations
• Discovery of a high-temperature antiferromagnetic state and transport signatures of exchange interactions in a Bi2Se3/EuSe heterostructure
• Interface-Induced Stability of Nontrivial Topological Spin Textures: Unveiling Room-Temperature Hopfions and Skyrmions
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